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Test must not skip stuff bits. Otherwise if stuff bit is corrupted
randomly, then it will also remain forcing the bus value to opposite
value during first bit of Error flag, thus REC will increment more!

SSP_OFFSET cant be longer than data bit time! Otherwise, we are gonna
sample in the next bit and generate bit error way earlier than we
inject bit error to the bus.

Furthermore, move declaration of "t_memory_reg" into
separate package so that they are not declared twice
when multiple memory maps are generated.

doc: Improve readme.

Closes #350

See merge request !329

# Conflicts:
#   README.md

doc: Improve readme.

Closes #350

See merge request !328

ci: Re-enable configs after debug.

Closes #205

See merge request !326

ci: Allow execute for gen_vrm.

Closes #205

See merge request !325

ci: Disable GCOV permanently.

Closes #205

See merge request !324

ci: Force GCOV from GHDL build.

Closes #205

See merge request !323

Resolve "SSP offset feature test"

Closes #205

See merge request !322

Resolve "SSP offset feature test"

Closes #205

See merge request !321

Resolve "SSP offset feature test"

Closes #205

See merge request !320